Product Qualification Program (PQP)

Kiwa PVEL’s Product Qualification Program (PQP) is a key tool for mitigating PV module procurement risk by transforming industry-leading bankability testing into procurement intelligence. Learn more about our PQP methodology, PQP test details and procedures, and case studies from the lab and the field here.

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Methodology and Why Testing Matters

Kiwa PVEL’s approach to testing and benchmarking PV module reliability has been our key focus for more than a decade. The PQP results enable data-driven solar procurement and investments for developers, financiers, and asset owners. Learn more about our testing methodology and why PQP testing matters here.

Manufacturer Sign-up

Kiwa PVEL’s PQP and Scorecards help manufacturers reach new buyers and demonstrate the quality of their products. Ready for your company’s PV modules to appear in Kiwa PVEL’s next Scorecard? Contact us to sign up for testing.

Thermal Cycling

Kiwa PVEL’s Thermal Cycling (TC) test assesses a PV module’s ability to endure changes in temperature.

Damp Heat

The Damp Heat (DH) test simulates long-term exposure to high temperatures and high humidity conditions.

Mechanical Stress Sequence

The Mechanical Stress Sequence (MSS) tests the mechanical durability of the PV module’s glass, frames and cells.

Hail Stress Sequence

The Hail Stress Sequence (HSS) subjects PV modules to extreme hail impacts and tests for subsequent power loss.

Potential-Induced Degradation

Potential-induced degradation (PID) tests for power loss that can occur at high voltages between the cells and PV module frames.

LID and LETID

Light-induced degradation (LID) and light-and-elevated temperature-induced degradation (LETID) testing quantifies PV module susceptibility to these early-life power loss mechanisms.

UV-Induced Degradation

Ultraviolet light-induced degradation (UVID) testing reveals how stable the PV module is under UV irradiation.

Backsheet Durability Sequence

The Backsheet Durability Sequence (BDS) assesses vital reliability risks for PV module backsheets including yellowing and polymer cracking.

PAN and IAM

PAN and IAM testing measures PV module performance at different temperature, irradiance and light angle conditions.

Field Exposure

The Field Exposure (FE) test provides an indication of real-world module performance over one year of outdoor conditions.

Laptop showing the PVEL PV Module Reliability Scorecard

Now available, the 11th Edition of Kiwa PVEL’s PV Module Reliability Scorecard features Top Performers from the industry’s best manufacturers and is the essential resource for PV module reliability and performance insights.